Op-Test's product line includes a range of offerings from turn-key test systems, to hardware and software modules for OEM test applications.  Our Test Head features a complete flux based HBLED parametric measurement unit and is easily integrated with common wafer probe handlers.   Op-Test also offers turn-key systems for testing loose packaged devices and devices in JEDEC trays for final test and incoming inspection applications.

CONTROLLED ENERGY TEST

C-PARAMETER BINNING

LIT DIE VISUAL INSPECTION