LEDinside, a leading platform for LED, LED Lighting and LED Market Research - Technology

A few Questions one Should Pay Attention to When Purchasing LED Lighting

Mon, 01 Apr 2013 17:18:27 +0800

Obvious energy saving effectiveness, long lifetime, no radiation, no RF interference, no white noise, soft light rays, and a wide operating voltage range are all special features of LED lighting, and becoming well received daily. As a consumer, how are you able to pick the best product to satisfy your needs with a wide range of LED lights spread out before you? First is through packaging and trademark. LED lighting products are forced by the country to include the following information on the outside packaging label: voltage rating, voltage range,......

Process Control Method for Accelerating LED Manufacturing Yield, Agility, and Profitability

Fri, 22 Mar 2013 16:41:02 +0800

Author: Steven Chen, Process Control Solutions Technologist, KLA-Tencor Corporation Introduction LED manufacturing is undergoing a tremendous transformation. The evolution to high brightness LED, larger wafer size and new complex architectures make LED manufacturing more challenging than ever before. Even though these trends greatly benefit the advancement of the LED industry in terms of LED efficiency and performance, they can also potentially negatively impact yield. In order for LED manufacturers to stay competitive in this dynamic environment, they need to have a comprehensive in-line process control strategy to improve the yield to make the solution cost effective. Currently, most LED manufacturers rely on inspection tools to inspect and provide defects of interest (DOI). Defect density is typically utilized as the gauge for statistical process control (SPC) control. However, the drawback of this approach is the fact that there can potentially be a lot of nuisance defect that does not cause yield loss. In looking at a defective wafer through an inspection tool, how do you determine which defects are killer defects that impact the yield or electrical performance, and which defects are nuisance? How can killer defects be detected at the earliest possible time to prevent costly excursions? These are the questions that must be addressed properly.

Fast and easy growth analysis on Patterned Sapphire Substrates (PSS)

Wed, 20 Mar 2013 17:21:42 +0800

In the next years, the use of PSS will further increase due to its high light extraction efficiency. Following this trend, LayTec‘s in-situ metrology software EpiNet 2 can be individually customized for various kinds of PSS. Our users can expand the substrate database by themselves. LayTec‘s Calibration Manual explains how to measure PSS reflectance in different pockets in one single calibration run. If required, LayTec also offers related customer trainings. Once the initial reflectance values of the PSS substrates are uploaded, the operator can choose the needed substrate in the RunType‘s Material Spec window (Fig. 1). As a result, all PSS wafers can be monitored with the same accuracy as standard sapphire substrates.

LayTec launches a new version of EpiCurve® TT

Wed, 20 Mar 2013 17:08:55 +0800

A major challenge of in-situ metrology on single-port reactors with small viewport geometries is the combination of curvature measurements by a blue laser with reflectance measurement at 405 nm. The blue laser is a must for patterned sapphire substrates (PSS) and double-side polished substrates. The 405 nm reflectance is indispensable for monitoring of InGaN MQW growth. Until now, it was impossible to have both features for reactors with only one small optical access because of the cross-talk effect. The new optical and electronic design of EpiCurve® TT eliminates this problem.

Osram Coordinates a BMBF Project for Developing High-brilliance Infrared Laser Sources

Fri, 22 Feb 2013 15:52:15 +0800

The aim is to increase the performance and lower the costs of laser systems for material processing As part of the ‘Integrated Microphotonics’ initiative, Osram Opto Semiconductors is coordinating the IMOTHEB project (Integrated microoptical and microthermal elements for diode lasers of high brilliance). The aim is to improve the performance of laser systems and at the same time reduce production costs. The project partners are DILAS Diode Laser and the Max Born Institute. The project (FKZ 13N12312) runs from October 1, 2012 to September 30, 2...

Be Careful of a Mercury Poisoning Disaster Caused by CFL Lightbulb

Tue, 22 Jan 2013 09:34:29 +0800

CFL bulbs contain mercury and when they break in your home a tiny amount of mercury will be released and become a more or less permanent part of your environment. Here’s a little taste of what Health Canada has to say about the dangers of mercury: If mercury is burned, heated, sprinkled or spilled in the home, a poisonous gas can be produced, requiring a clean-up procedure. Your first instinct when you break one of those coiled CFL light bulbs will be to get out the vacuum cleaner. Don’t. Here’s what Health Canada suggests: The amount of mercury found...

Scientists Inspired by Fireflies to Develop Brighter LED Bulbs

Fri, 11 Jan 2013 11:29:04 +0800

Fireflies have been the source of inspiration for scientists and research groups working on developing better lighting devices for a sustainable future. Using this technology alone, a team of researchers at Syracuse University debuted zero-energy lights. Now an international team of scientists are using nature’s technology to develop LED light bulbs which produce more luminescence using the same amount of energy. In all types of fireflies, the bioluminescence is emitted through the cuticle of their exoskeleton, however, a part of the luminescence is reflected back...

TI Makes LED Lighting Design Easy and Fast

Tue, 18 Dec 2012 08:46:33 +0800

Industry’s first fully integrated LED drivers in industry-standard IC packages helps developers skirt design complexities Texas Instruments Incorporated (TI) (NASDAQ: TXN) introduced two fully integrated LED driver micro-modules that eliminate the external components and complex layout placement challenges typical of LED driver designs. The 450-mA TPS92550 and TPS92551 DC/DC LED driver modules are the industry’s first to incorporate all the required power and passive circuitry into a single IC package to deliver up to 23W of power to...

LayTec : Advanced Stress Control of GaN on Silicon(001) with EpiCurve TT during HEMT Growth

Fri, 14 Dec 2012 16:18:52 +0800

The challenges of GaN growth on Si(111), especially for LED growth, are well known and meanwhile controllable. Cooldown-assisted layer cracking as a result of high tensile stress can be prevented and crystal quality can be enhanced by sophisticated interlayers. Numerous institutions worldwide are already using LayTec‘s EpiCurve TT with advanced curvature resolution for high quality GaN devices on large scale Silicon substrates. Now, this experience is being transferred to growth on Si(001) and Si(110), because GaN based power electronics can be easily in...

Our Fascination with Fluorescents and the end of the Affair?

Thu, 06 Dec 2012 09:47:00 +0800

Earlier this week, news emerged from the US that researchers have developed a new type of lighting that could replace fluorescent bulbs. The new source is reportedly more efficient, produces a better quality of light and is flicker free. Whilst the concept of light from polymers is certainly intriguing, I was somewhat taken aback by the attention the story received. After all, we already have viable alternatives for the fluorescent tube that does all of the above. So why are we under the impression that we don’t? To understand the context we need to look back. The UK ...