2014-05-23

KLA-Tencor: Wafer Defect Detection Inspection Trends

Optic inspection is still the mainstream wafer defect detection method in the inspection and metrology field, while E-beam will continue to be a niche market, said KLA-Tencor Chief Marketing Officer Brian Trafas during the opening ceremony of the new training facility held at the company’s Hsinchu branch on May 23, 2014.
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2014-05-23

Taiwan Continues to Play Key Role in KLA-Tencor Business Strategy

Global process control and yield management product leader KLA-Tencor’s newly launched Taiwan Training Facility continues to reflect the market’s important role in the company’s business strategy.
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2013-08-26

KLA-Tencor: Optical Inspection Won’t Be Replaced by E-beam Anytime Soon

Despite of downpours and strong gusts caused by severe tropical storm Trami that hit Taiwan on Aug. 21, 2013, optical inspection giant KLA-Tencor Corporation outlined its 2013 product plans and business strategy at a press conference in Taipei that day. KLA-Tencor that usually keeps a low profile responded to questions concerning competitor Hermes Microvision Inc. (HMI), a large Taiwanese E-beam inspection equipment manufacturer. KLA-Tencor emphasized, while E-beams have higher resolution than optics, its inspection speed is too slow, and pointed out optical inspection is still the mainstream inspection method on the market. The company also announced it will be establishing equipment training centers in Taiwan, which reflects the aim of KLA-Tencor’s trip to the country to firmly establish its presence.
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2013-04-27

KLA-Tencor Announces Novel Defect Discovery and Monitoring Technology

NanoPoint™ enables fast, practical design qualification and highly sensitive process monitoring by leveraging critical patterns KLA-Tencor Corporation (NASDAQ: KLAC) announced NanoPoint™, a new family of patented technologies for its 2900 Series defect inspection system. NanoPoint represents an entirely new way to discover and monitor defects, at optical speed and on existing optical defect inspection equipment. NanoPoint's value has already been demonstrated on early metal layers, where line-edge roughness (LER) on dense pattern had previously l...
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2013-04-12

KLA-Tencor Corporation Receives Intel's Preferred Quality Supplier Award

 KLA-Tencor Corporation has been recognized as one of 17 companies receiving Intel Corporation's Preferred Quality Supplier (PQS) award for their performance in 2012. KLA-Tencor Corporation is recognized for their significant contributions providing Intel with process control capital equipment and services, deemed essential to Intel's success.  "KLA-Tencor is honored to receive Intel's Preferred Quality Supplier award for a second consecutive year—a true testament to our employees' expertise and world class inspection and metrology equipment and services," ......
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2013-01-31

KLA-Tencor Announces New eS805(TM) Electron-Beam Inspection System

New tool detects electrical issues and small physical defects; helps optimize high-speed optical wafer inspection systems for preferential capture of yield-relevant defects KLA-Tencor Corporation (NASDAQ: KLAC) announced the eS805™, a new electron-beam inspection system for leading-edge chip manufacturers. Benefiting from more than twenty years of KLA-Tencor's e-beam inspection development and manufacturing expertise, the eS805 offers strong capability in detection of very small defects and defects that cause electrical problems in the integrated circuit, ...
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2012-06-25

LEDforum 2012 Guangzhou Highlights: The Demands for LED Lighting will keep Increasing

LEDforum 2012 Guangzhou organized by LEDinside and Guangzhou International Lighting Exhibition, as well as co-sponsored by CNLEDW.com ,has grandly opened at the Chinese Export Commodities Fair Pazhou Complex, Area B, Room #8 on June 11, 2012. This LEDforum has invited global LED market leaders from Osram, Philips Lumileds, Seoul Semiconductor, Henkel (China), Lextar, Aixtron, Veeco Instruments, KLA-Tencor and Laytec to give wonderful presentations.   Dr. C.L. Liu from TrendForce Corp. gave an opening speech Louis...
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2012-06-13

DOE Announces $7 million Investments to Support SSL Development

Recently, according to The U.S. Department of Energy (DOE), it has released more than $7 million for three innovative lighting projects at companies in California, Michigan and North Carolina that aim to lower the cost of manufacturing high-efficiency solid-state lighting (SSL) technologies LEDs and OLEDs.   The two-year projects selected will focus on significantly reducing manufacturing costs while continuing to improve the quality and performance of solid state lighting technologies.  These investments, which will leverage an additional $5 million in p...
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2009-12-03

KLA-Tencor Launches ICOS(R) WI-2250 Wafer Inspector

KLA-Tencor Corporation, a supplier of process control and yield management solutions for the semiconductor and related industries, introduced the next addition to its wafer inspection portfolio, the ICOS(R) WI-2250. According to the company, the ICOS WI-2250 offers a dramatic improvement in inspection speed, compared to currently available products, allowing manufacturers to transition to larger LED and MEMS wafer sizes.
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Cree announces the commercial availability of the XLamp® XD16 LED, the industry’s first Extreme Density LED, which delivers up to 5 ½ times higher lumen density than Cree’s previous generation of high power LEDs.

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LG Innotek today announced that the company has developed the world's first 100mW (mill watts) UV-C LED. This development is 2 years ahead of the industry forecast that predicted its development would be successful by 2020.

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