Veeco Instruments Inc will introduce a new ContourGT™ Optical Surface Profiler configuration optimized for characterizing HB-LED PSS at the SEMICON West trade shows and seminars in San Francisco this week.
The ContourGT-X8 PSS combines advanced non-contact 3D measurement capabilities with unique Veeco PSS metrology hardware and software technology, and a Wafer Automation System Developer's Kit that provides a tailored solution for PSS quality assurance and quality control applications where high-throughput and repeatability capabilities are essential.
According to Mark R. Munch, Ph.D., Executive Vice President, Veeco Metrology & Instrumentation, "the ContourGT-X8 PSS gives wafer suppliers and HB-LED device manufacturers an affordable way to obtain high-throughput, 3D surface metrology to enhance productivity, while assuring the quality of their end products."
Moreover, Ross Q. Smith, Vice President and General Manager, Veeco Optical Industrial Metrology, pointed out that, "We have worked closely with PSS wafer suppliers and HB-LED manufacturers to develop the ContourGT-X8 PSS, ensuring that it has the full breadth of capabilities necessary to deliver the required measurements. In addition, we have teamed with leading wafer automation providers such as CHAD Industries to develop a compelling value proposition for HB-LED manufacturers who often need flexibility in automation solutions. We expect the ContourGT-X8 PSS to become the industry standard as a simple-to-operate, 7/24, high-performance PSS surface metrology solution."
