The MicroSense UltraMap C200A is an automated LED Sapphire Wafer Measurement system based on MicroSense's proprietary two sided capacitive sensing technology. The system measures critical substrate parameters including Thickness, TTV, Bow, Warp and Local Thickness Variation (LTV) with high throughput. The UltraMap C200 is designed for sapphire wafer manufacturers and LED chip makers who require better wafer geometry inspection with higher measurement repeatability, compared to traditional optical metrology systems.

Taiwan LED wafer manufacturer Epistar announced more good news for its market layout in LED lighting. According to a report by global financial service firm Morgan and Stanley, Epistar’s infiltration into CREE’s supply chain, controlling production of high efficiency red LED chips and mid-to-low watt sapphire wafer orders, lighting proportion within the company will continue to rise for 4Q.