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2018-02-05

IEMN Shows More Than 1400 V on ALLOS’ New GaN-on-Si Epiwafer Product

Latest results from IEMN show more than 1400 V breakdown voltage for both vertical and lateral measurements on ALLOS’ upcoming GaN-on-Si epiwafer product for 1200 V devices.

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[News] FORVIA HELLA Launches Fully Localized High-Resolution Headlamp System SSL | HD in China for the First Time

International automotive supplier FORVIA HELLA has fully localized its digital, high-resolution headlamp system SSL | HD in China for the first time in the context of a new series project. Both series development as well as manufacturing take ... READ MORE

[News] More Than a Snapshot in Time: Supplementary Vital Sign Offers Deeper Insight into Long-Term Health Risks

Heart rate, blood flow, and other physiological metrics have been central to health monitoring for decades. However, numerous relevant changes in the human body develop insidiously over time and may go undetected when relying on single measure... READ MORE

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