2013-02-19

Laytec Launches New in-situ GaN LED Monitoring System

Laytec has upgraded in-situ GaN LED monitoring system. LED manufacturers would know the emission wavelength of the final device during MOCVD growth. Today, according to the Solid State Lighting road map, the wavelength variation across a wafer should be less than 1 nm. This means a less than 1 K (10C) variation of the GaN surface temperature during InGaN MQW growth. LayTec’s Pyro 400 is widely used for enabling fab-wide GaN surface temperature uniformity in many LED manufacturers production lines. Meanwhile, more complex LED structur...
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Daktronics (NASDAQ: DAKT), the leading U.S.-based designer and manufacturer of dynamic video communication displays and control systems for customers worldwide, today announced the acquisition of the intellectual property (IP), equipment asset... READ MORE

On December 9, the three-day Live Design International (LDI) show concluded successfully in Las Vegas, USA. As the final major industry event of the year, Absen made a strong appearance with a lineup of all-star products, highlighting its tech... READ MORE