2017-05-02

Programmable Light Source Improves Wafer Level Image Sensor/Detector Testing

A new digitally programmable, color tunable, calibrated light source from Gamma Scientific is a turnkey, drop-in addition to commercially available systems for wafer level testing of CCD and CMOS sensors.  Specifically, the RS-7-4 SpectralLED™ Tunable LED Light Source bolts directly on to existing image sensor testers from manufacturers such as Teradyne and National Instruments, and can also be readily adapted to test head manipulators and handler instrumentation custom built by end users.  
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Cree LED, a Penguin Solutions brand (Nasdaq: PENG), and Blizzard Lighting LLC (‘Blizzard’) today announced that they have reached a mutually beneficial settlement resolving a patent infringement dispute involving Cree LED’s p... READ MORE

ALLOS Semiconductors of Germany and Ennostar Corporation of Taiwan today announced a strategic partnership to bring 200 mm GaN-on-Si (gallium nitride on silicon) LED epiwafers for microLED applications into volume production. This collaboration r... READ MORE