2017-05-02

Programmable Light Source Improves Wafer Level Image Sensor/Detector Testing

A new digitally programmable, color tunable, calibrated light source from Gamma Scientific is a turnkey, drop-in addition to commercially available systems for wafer level testing of CCD and CMOS sensors.  Specifically, the RS-7-4 SpectralLED™ Tunable LED Light Source bolts directly on to existing image sensor testers from manufacturers such as Teradyne and National Instruments, and can also be readily adapted to test head manipulators and handler instrumentation custom built by end users.  
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Stanley Electric Co., Ltd. (Head Office: 2-9-13 Nakameguro, Meguro-ku, Tokyo; President and CEO: Yasuaki Kaizumi) has significantly improved the emission efficiency of its UV-C LEDs at a wavelength of 265nm—widely recognized as the most ... READ MORE

Nichia, the world's largest LED / Laser Diode manufacturer and inventor of the high-brightness blue and white LEDs, has confirmed a reduction in product waste and an increase in sales through a pilot test conducted in a retail garden cente... READ MORE