2017-05-02

Programmable Light Source Improves Wafer Level Image Sensor/Detector Testing

A new digitally programmable, color tunable, calibrated light source from Gamma Scientific is a turnkey, drop-in addition to commercially available systems for wafer level testing of CCD and CMOS sensors.  Specifically, the RS-7-4 SpectralLED™ Tunable LED Light Source bolts directly on to existing image sensor testers from manufacturers such as Teradyne and National Instruments, and can also be readily adapted to test head manipulators and handler instrumentation custom built by end users.  
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Macroblock, a leading provider of LED driver ICs, is making its debut at SID Display Week, the world’s premier event for display technologies, held from May 5 to May 7. At the exhibition, Macroblock is showcasing a broad portfolio of pro... READ MORE

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